The breakdown in a reverse biased p-n junction diode is more likely to occur due to

Options

A. large velocity of the minority charge carriers if the doping concentration is small
B. large velocity of the minority charge carriers if the doping concentration is large
C. strong electric field in a depletion region if the doping concentration is small
D. strong electric field in the depletion region if the doping concentration is large

Answer

A, D

Explanation

In reverse biasing, the minority charge carriers will be accelerated due to reverse biased, which on striking with atoms cause ionisation resulting secondary electrons and thus more number of charge carriers.
When doping concentration is large, there will be large number of ions in the depletion region, which will give rise to a strong electric field.