To measure the roughenss of the surface of a material, which of the following micrscope is preferred for better result ooutput?

Options

A. Compound micropsope
B. Electron microscope
C. Atomic force microscope
D. None of these

Explanation

To determine which microscope is preferred for measuring the roughness of the surface of a material, we can analyze the options provided:

1. **Compound Microscope**: This type of microscope uses multiple lenses to magnify small objects. While it can provide a good view of samples, it is not specifically designed for measuring surface roughness at a microscopic level.

2. **Electron Microscope**: This microscope uses a beam of electrons to create an image of the specimen. It offers high resolution and can visualize very small structures. However, it is primarily used for imaging rather than for measuring surface roughness.

3. **Atomic Force Microscope (AFM)**: This microscope is specifically designed to measure surface topography at the atomic level. It uses a cantilever with a sharp tip that scans the surface of the material. AFM is highly sensitive and can provide detailed information about surface roughness, making it the preferred choice for this measurement.

4. **None of these**: This option suggests that none of the listed microscopes are suitable, which is incorrect since the Atomic Force Microscope is indeed suitable.

Based on the analysis, the best choice for measuring the roughness of a material's surface is:

**Answer: Atomic Force Microscope (Option 3)**